SPM8800 Scanning probe microscopes

SPM-8800 allows for advanced digital controls for both STM and AFM scanning modes.

 Features

        STM (Scanning Tunneling Microscope)  

       2 AFM (Atomic Force Microscope) Oscillating and Contact Mode

       Automatic Approach and Retreat function to avoid damaging sample/tip

       True 3D graphics processing

       Depth and Width of Calibration Function                 

       Automatic identification of the different scanners

       CCD to assist in aligning laser to probe

       With dual-display, real-time adjustment and control parameters image display screen

       WINDOWS VISTA, XP compatibility for SPM Controller and Post-Processing software 

  Technical Parameters:

 

Resolution	Horizontal: 0.1 nm vertical: 0.01 nm
Scan range	20µm X 20µm
Scanning Platform Size	20 nm x 20 nm
Scanning Frequency	0.1Hz —100Hz
Scan Rotation	0 — 360°
D / A precision	16bit
A / D precision	16bit,16-channel
Bias voltage	0 —10V
Tunneling Current Preferences	0.1nA —10nA
Image resolution	512X512,1024X1024
Color Quality	True Color

SPM8800 Scanning probe microscopes